@prefix p: <http://www.wikidata.org/prop/> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .
@prefix schema1: <http://schema.org/> .
@prefix wd: <http://www.wikidata.org/entity/> .
@prefix wds: <http://www.wikidata.org/entity/statement/> .
@prefix wdt: <http://www.wikidata.org/prop/direct/> .
@prefix wdtn: <http://www.wikidata.org/prop/direct-normalized/> .
@prefix wikibase: <http://wikiba.se/ontology#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

wd:Q55829958 rdfs:label "Toshiba Nanoanalysis Corporation"@en,
        "東芝ナノアナリシス株式会社"@ja ;
    schema1:dateModified "2026-03-21T13:26:10+00:00"^^xsd:dateTime ;
    schema1:description "subsidiary of Toshiba specializing in chemical and physical analysis of nano-scale materials"@en,
        "bedrijf uit Japan"@nl ;
    schema1:version 2474207215 ;
    wikibase:identifiers 4 ;
    wikibase:sitelinks 0 ;
    wikibase:statements 9 ;
    p:P14075 wds:Q55829958-8D79267C-14F8-4F94-9067-A04E530A780C ;
    p:P159 wds:Q55829958-bbb2b1df-4e18-5ce2-5491-3b78d7a0f089 ;
    p:P17 wds:Q55829958-c9c58b9a-4cba-dfda-51e5-21c686b841c4 ;
    p:P2088 wds:Q55829958-1A8370C3-AD43-4B84-90C1-FEDA01BD6AAA ;
    p:P214 wds:Q55829958-9CB91F4D-5417-4354-9A08-D235061599B1 ;
    p:P31 wds:Q55829958-f16d739f-43c4-3fd7-2db2-5fba935f1208 ;
    p:P6782 wds:Q55829958-60C8D901-DFBB-4D3E-BF42-6E5A7BDE5B68 ;
    p:P749 wds:Q55829958-67c6337e-4c58-c341-8510-3cdbbc0075c6 ;
    p:P856 wds:Q55829958-a7f3a4d1-40de-4a8d-7041-238c08aa3cda ;
    wdtn:P214 <http://viaf.org/viaf/77147663161360552823> ;
    wdt:P14075 "102953" ;
    wdt:P159 wd:Q164234 ;
    wdt:P17 wd:Q17 ;
    wdt:P2088 "toshiba-nanoanalysis" ;
    wdt:P214 "77147663161360552823" ;
    wdt:P31 wd:Q4830453 ;
    wdt:P6782 "05p9h0d44" ;
    wdt:P749 wd:Q49125 ;
    wdt:P856 <http://www.nanoanalysis.co.jp/> .

